The anal. of high-purity copper was performed using a d.c. arc spectrometer. The use of a N2-purged optical path allowed for the determination of S with sub-ppm detection limits as well as the determination of P free from spectral interferences from Cu itself. The current-controlled d.c. arc power supply combined with the simultaneous data collection of both peak and background data, provide exceptionally reproducible sample burns, which is indicated in the detection limits obtained for Ag, As, Bi, Fe, Ni, P, Pb, S, Sb, Se, Sn. Te, and Zn in high-purity Cu.